For this edition of INMMIC, we are excited to announce a special session on microwave measurements. We invite contributions on various aspects of microwave metrology, including:
– Measurement uncertainty
– Calibration
– Sensing
– Special-purpose instrumentation
Submissions are welcome for a wide range of MHz-to-THz topics beyond nonlinear circuits, including but not limited to:
– AI/machine learning for measurements
– Characterization of material properties
– Quantum computing and metrology
– Over-the-air testing
– Bio/medical devices
– Automotive/aerospace applications
For any information please refer to the special session organizers Gian Piero Gibiino gianpiero.gibiino@unibo.it and Olof Bengtsson Olof.Bengtsson@fbh-berlin.de