For this edition of INMMIC, we are excited to announce a special session on microwave measurements. We invite contributions on various aspects of microwave metrology, including:

– Measurement uncertainty

– Calibration

– Sensing

– Special-purpose instrumentation

Submissions are welcome for a wide range of MHz-to-THz topics beyond nonlinear circuits, including but not limited to:

– AI/machine learning for measurements

– Characterization of material properties

– Quantum computing and metrology

– Over-the-air testing

– Bio/medical devices

– Automotive/aerospace applications

Authors submitting papers on these topics should select the track “Special session on metrology” in EDAS.

For any information please refer to the special session organizers Gian Piero Gibiino gianpiero.gibiino@unibo.it and Olof Bengtsson Olof.Bengtsson@fbh-berlin.de

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