For this edition of INMMIC, we are excited to announce a special session on microwave measurements. We invite contributions on various aspects of microwave metrology, including:

– Measurement uncertainty

– Calibration

– Sensing

– Special-purpose instrumentation

Submissions are welcome for a wide range of MHz-to-THz topics beyond nonlinear circuits, including but not limited to:

– AI/machine learning for measurements

– Characterization of material properties

– Quantum computing and metrology

– Over-the-air testing

– Bio/medical devices

– Automotive/aerospace applications

For any information please refer to the special session organizers Gian Piero Gibiino gianpiero.gibiino@unibo.it and Olof Bengtsson Olof.Bengtsson@fbh-berlin.de

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